17:48 tmclaugh 

- Add autopano-sift:
Autopano analyses two or more images and automatically generates control
points - coordinates in the images where the views overlap.  This can be fed
to hugin which then stitches the files together and enblend which combines
the colors to remove seam lines.

WWW: http://user.cs.tu-berlin.de/~nowozin/autopano-sift/

- Add entry to LEGAL:
The use of this software is restricted by certain conditions.  See the
"LICENSE" file distributed with the program for details.

The University of British Columbia has applied for a patent on the SIFT
algorithm in the United States.  Commercial applications of this software
may require a license from the University of British Columbia.

PR:             95746
Submitted by:   J.R. Oldroyd <fbsd@opal.com>
Maintained by:  Carlos E. G. Carvalho <cartola@openit.com.br>